• 微纳米操纵机械手 MicroManipulators

    MM3A微纳米操纵机械手 MM3A Series

    微纳操纵机械手 MM3A-EM

    微纳操纵机械手 MM3A-LMP

    微纳操纵机械手 MM3A-LS

    微纳操纵机械手 MM3E-EM

    微纳米操纵机械手插件 Plug-ins for Micromanipulators

    MGS2-EM微镊子

    MTW-EM 大微镊子

    微弱力测量装置 Force Measurement System

    绕臂旋转功能插件 Rotational Tip

    微弱电流测量屏蔽装置 Low-Current Measurement Kit

    显微焊接装置 Micro Soldering Unit

    气体注入电子束诱导沉积功能(GIS)

    MIS-EM 微注入插件系统

    SEM 样品子台 SEM Stages

    显微加热台

    显微加热制冷台

    XYZ-12830高精度闭环平移样品台

    E5AT 压电陶瓷五轴台

    TEM样品提取专用设备 Dedicated Tools for TEM samples” Pick-up

    LOS TEM样品提取专用设备

    低温冷冻TEM样品提取专用设备

    联用扫描电镜的原子力显微镜力 Super-flat AFM for SEM

    EBIC/EBAC成像模块 EBIC/EBAC Imaging Module 

    扫描电镜联用AFM

    纳米车床 (Nanolathe)

    其它 Others

    RT-STEM Rotational Axis(旋转轴)

    PS4 科研系列简版

    PW8.4-8  探针台系列

    PS探针台系列 PS Series

HOME

ABOUT US

PRODUCTS

NEWS

DOWNLOAD

CONTACT US

  • 回到顶部
  • 021-61152577
  • QQ客服
  • 微信二维码
image

扫描电镜联用AFM

你有没有想过用扫描电子显微镜,快速获取3d 信息?Kleindiek 和 Nanosurf 为你提供了即插即用的改进解决方案。原子力显微镜(AFM和扫描电子显微镜(SEM)的结合开启了令人兴奋的新可能性。扫描电镜在微米和纳米范围内被广泛用于分析,AFM 技术对于研究不同材料的表面和特性以及纳米细节非常有用。 Kleindiek 纳米技术公司开发了一种超薄、紧凑和灵活的扫描仪,使得 AFM 可以在扫描电镜下进行。结合 Nanosurf 的 SPM 控制器和易于使用的控制软件,从扫描电镜检查的横向尺寸和材料的信息可以很容易地补充精确的地形和力的信息就地。这两组数据的独特和轻松可用性为现有工具带来了新的增值功能,并减少了实验周期时间,从而提高了研究吞吐量。

原子力显微镜系统小巧轻便,可以放入任何扫描电子显微镜,它甚至可以与你的SEM的样品交换仓(空气锁)兼容。

这个系统在空气中也能独立工作。

 

YOUR ADVANTAGES

3D information from simultaneous

SEM and AFM pictures

Notably compact (height 10 mm)

Simple to operate

Load-lock compatible

Extremely stable operation

Easy sample and tip exchange

without laser adjustment

Can be used in combination with

micromanipulators and other

in-situ and ex-vivo tools

Works in air and in SEM

 

Coarse positioner

• The ultra-flat three-axis manipulator with

unmatched stability and precision

• Operating range A 10 mm, B 80°, C 5 mm

• Piezo range A 1 µm, B 10 µm, C 1 µm

• Resolution A 0.25 nm, B 2.5 nm, C 0.25 nm

• Low drift 1 nm/min

• Reliable operation (one year endurance test)

• Fast pre-positioning by hand

• No backlash, creep or reversal play

• Fine and coarse displacement in one drive

A = left/right, B = up/down, C = in/out

 

AFM sensor

• Cantilever with integrated piezoresistive sensor

• Operates in contact mode with dynamic mode

available in the near future

• Length 400 µm

• Width 50 µm

• Height 4 to 5 µm

• Tip radius < 20 nm

• Tip height > 5 µm

• Tip force constant 2–4 N/m

• Maximum tip force 80 µN

• Resistance 500 to 650 Ω

• Sensitivity 3.1 × 10–3 mV/nm @ Vbridge = 2.5 V

 

AFM scanning unit

• Ultra-flat scanner with scan ranges up to 15 µm

in XY and 5 µm in Z

 

Shuttle platform

• SEM and FIB load-lock compatibility

• Quick and easy probe tip and sample exchange

• Total system height 9 mm

• Total system width 95 mm

• Maximum sample size 12 mm × 12 mm × 1 mm

• Weight 100 g

 

AFM software

• User-friendly control and imaging software

• Built-in post-processing and analysis capabilities

• Integrated lithography and scripting functions

SPM S200 controller

• 16-bit data acquisition with up to 16 lines/s

• Up to 2048 × 2048 scan area data point

• Up to 65536 spectroscopy data points

• Hardware sample tilt compensation

• 16-bit scanner drive signals

• One-wire connection to scanner

• USB 2.0 connection to computer

• Modular design allows future upgrades that

enable extended AFM measurement modes

• Power supply 90–240 V AC @ 50/60 Hz (100 W)

• Size 470 × 120 × 80 mm

• Weight 2.4 kg

产品中心

全部